Shortening Carbon Nanotube-Tipped AFM Probes
نویسندگان
چکیده
A method is presented to indirectly measure and shorten carbon nantoubes grown from the tips of atomic force microscope (AFM) probes. The measurement component exploits the nanotubes ability to elastically buckle and requires only those signals and actuators available on a standard AFM. The shortening operation is facilitated by electric arcing using a conducting niobium substrate. The shortening operation produces stable carbon nanotubes at the tips of AFM probes which can then be functionalized for use as high-resolution, chemically-specific force probes. An application to AFM-based DNA sequencing is also discussed.
منابع مشابه
Measuring, Shortening and Functionalizing Carbon Nanotube Tipped AFM Probes for DNA Sequencing
A method is presented to indirectly measure and shorten carbon nantoubes grown from the tips of atomic force microscope (AFM) probes. The measurement component exploits the nanotubes ability to elastically buckle and requires only those signals and actuators available on a standard AFM. The shortening operation is facilitated by electric arcing using a conducting niobium substrate. The shorteni...
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